IEEE Transactions on Semiconductor Manufacturing
journal

The IEEE Transactions on Semiconductor Manufacturing is a quarterly peer-reviewed scientific journal published by the IEEE. It covers research on semiconductor device fabrication, including simulation and modeling from the factory to the detailed process level, defect control, yield analysis and optimization, production planning and scheduling, environmental issues in semiconductor manufacturing, and manufacturability improvement. The editor-in-chief is Reha Uzsoy (North Carolina State University). According to the Journal Citation Reports, the journal has a 2020 impact factor of 2.874.
The journal is a joint publication of the IEEE Solid-State Circuits Society, IEEE Components, Packaging & Manufacturing Technology Society, IEEE Electron Devices Society, and the IEEE Reliability Society.
The public source identifies “IEEE Transactions on Semiconductor Manufacturing” as journal. This brief keeps that definition visible, then builds a research path around IEEE, Transactions and Semiconductor.
Why this record matters
A short description can identify a subject without explaining its stakes. For “IEEE Transactions on Semiconductor Manufacturing”, the useful work is to connect “journal” to the records capable of establishing context and consequence.
Named sources, stable identifiers and responsible institutions provide the strongest route from overview to verifiable evidence. The source revision retrieved here is dated Jan 29, 2026. The linked authority identifier is Q1832128. 3 of 3 selected statements include explicit references; 1 carry qualifiers and 0 use preferred rank. The first chronological checks are 2020.
Overview language is designed for orientation and should not be treated as a substitute for the evidence cited beneath it. The lead is largely declarative, so disagreement and counter-evidence require a deliberate search beyond the opening account. Authority statements aid reconciliation but still require their own references, qualifiers and ranks to be checked.
How to read it
Use the entry as an orientation point, then follow its citations and revision history. Names, dates and institutional relationships should be checked against the original record.
- Subject orientation
- Search vocabulary
- Locating named sources
The closest primary source, responsible institution and strongest cited specialist reference.
Three-step research path
- Establish the record: confirm the title “IEEE Transactions on Semiconductor Manufacturing”, its source revision and the description used here.
- Expand the search: follow IEEE Transactions on Semiconductor Manufacturing primary sources, IEEE Transactions on Semiconductor Manufacturing archive and IEEE research across catalogues and specialist indexes.
- Test the account: compare the strongest cited source with the responsible institution’s current record and note any disagreement.
Questions for further research
- Which source most directly establishes the central claim about “IEEE Transactions on Semiconductor Manufacturing”?
- Which institution is responsible for the underlying evidence?
- What terminology or title could unlock a more precise catalogue search?
Search terms from this dossier
This entry incorporates text from “IEEE Transactions on Semiconductor Manufacturing” on English Wikipedia. Contributors are listed in the page history. Text is available under the Creative Commons Attribution-ShareAlike 4.0 License. Selected authority identifiers and statements are retrieved from Wikidata under CC0; their references and qualifiers remain part of the verification path.