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90 nm process

semiconductor manufacturing processes with a 90 nm MOSFET technology node

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Record originEnglish Wikipedia
Text licenseCC BY-SA 4.0
Source revisionAug 29, 2026
Entity authorityQ1051638
Source-derived summary

The 90 nm process refers to the technology used in semiconductor manufacturing to create integrated circuits with a minimum feature size of 90 nanometers. It was an advancement over the previous 130 nm process. Eventually, it was succeeded by smaller process nodes, such as the 65 nm, 45 nm, and 32 nm processes.

It was commercialized by the 2003–2005 timeframe, by semiconductor companies including Toshiba, Sony, Samsung, IBM, Intel, Fujitsu, TSMC, Elpida, AMD, Infineon, Texas Instruments and Micron Technology.

The origin of the 90 nm value is historical; it reflects a trend of 70% scaling every 2–3 years. The naming is formally determined by the International Technology Roadmap for Semiconductors (ITRS).

The 300 mm wafer size became mainstream at the 90 nm node. The previous wafer size was 200 mm diameter.

The 193 nm wavelength was introduced by many (but not all) companies for lithography of critical layers mainly during the 90 nm node. Yield issues associated with this transition (due to the use of new photoresists) were reflected in the high costs associated with this transition.

Editorial summary

“90 nm process” enters the record as semiconductor manufacturing processes with a 90 nm MOSFET technology node. Crown Archives preserves that source wording while asking what process, semiconductor and manufacturing can confirm, complicate or overturn.

Editorial reviewUseful for establishing the present vocabulary of the subject while preserving a route back to the evidence on which that vocabulary rests. The current lead gives the account dated anchors—2003, 2005—that can be checked directly. The selected authority fields contribute no independent date. Its strongest next move is a source search built around process, semiconductor and manufacturing.
Editorial analysis

Why this record matters

“90 nm process” is worth following because a concise public description often conceals a longer documentary argument. Here, process, semiconductor and manufacturing provides the most credible route into that argument.

Evidence profile

Datasets, specimens, observations and peer-reviewed methods provide the appropriate test for the technical claims summarized here. The source revision retrieved here is dated Aug 29, 2026. The linked authority identifier is Q1051638. None of the 0 selected statements returned an explicit reference. The first chronological checks are 2003 and 2005.

Critical limits

Current terminology should not be projected backward without checking the classification used when the underlying evidence was created. The lead is largely declarative, so disagreement and counter-evidence require a deliberate search beyond the opening account. Authority statements aid reconciliation but still require their own references, qualifiers and ranks to be checked.

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Source & attribution

This entry incorporates text from 90 nm process” on English Wikipedia. Contributors are listed in the page history. Text is available under the Creative Commons Attribution-ShareAlike 4.0 License. Selected authority identifiers and statements are retrieved from Wikidata under CC0; their references and qualifiers remain part of the verification path.